Seipin resides in the endoplasmic reticulum and a shortage of this protein in cells leads to abnormal lipid droplets – that is, cells often have lots of tiny lipid droplets or a few giant ones. Lipid droplets form from the endoplasmic reticulum in an organized manner, but little is known about the cellular machinery that gives rise to lipid droplets.Ī protein called seipin is thought to be involved in lipid droplet formation. The cell then stores the triglycerides in a different structure called the lipid droplet. Enzymes in a compartment of the cell called the endoplasmic reticulum catalyze the chemical reactions needed to make these triglycerides. Actual observation range can be calculated using this formula: actual field of view (diagonal mm) = viewing field (viewing number) ÷ objective magnification.Living organisms often store energy in the form of fat molecules called triglycerides. Selectable from required field of view and magnification. Rotatable stage for POL, from any position can be 45° click stopĪdapter for camera observation.
Thick slide holder for the right (left) opening, for pressing the slide glass to stage top surface, the specimen is difficult to lift Thin slide holder for the right (left) opening Silicone rubber operability handle rubber for improvement (thick type) Select by the number of objectives needed and types also with/without slider attachment. Hand switch for light intensity of halogen (dimmer TH4-100 (200) without hand switch)Īttachment for objectives and sliders. Halogen and Halogen IR Light Resource ConfigurationĮxtender cable for halogen lamp housing, cable length 1.7 m (requires cable extension when necessary)ġ00V (200V) specification power supply for 100W/50W halogen lamp Power supply for LED lamp housing, requires BXFM systemįluorescence Light Resource ConfigurationĭF converter for BX3M-URAS-S, required for observation with DF when necessary Standard LED Light Resource ConfigurationĭF converter for BX3M-URAS-S, required for observation with DF and BF when necessary This means a higher EF value, resulting in excellent image contrast.Ĭlick here for details about UPLFLN-P objective lenses Click here for details about PLN-P / ACHN-P objective lenses Thanks to Olympus’ sophisticated design and manufacturing technology, the UPLFLN-P strainfree objectives reduce internal strain to the minimum. Measurement of image contrast (living organisms, etc.)Īpproximate Measurement of Retardation Levelįor more accurate measurement, it is recommended that compensators (except U-CWE2) be used together with the interference filter 45-IF546. Measurement of Low Retardation Level (living organisms, etc.) Measurement of Retardation Level (crystals, living organisms, etc.)Įnhancement of Image Contrast (living organisms, etc.) (crystals, macromolecules, living organisms, etc.) Measurement of High Retardation Level (R *>3λ) For easier measurement and high image contrast, the Berek and Senarmont compensators can be used, which change the retardation level in the entire field of view. Measurement retardation level ranges from 0 to 20λ. Six different compensators are available for measurements of birefringence in rock and mineral thin sections. The frames are outfitted with ESD capability to protect electronic samples.Īn Extensive Range of Compensator and Wave Plates Both frames can be configured with manual, coded, or motorized components. There are two types of microscope frames in the BX3M series, one for reflected light only and one for both reflected and transmitted light. Modular design enables various configurations to meet users’ requirements.īelow you can find some examples of configuration for materials science.īX53M Reflected and Reflected/Transmitted Light Combination *T-BF can be used when selecting Reflected/Transmitted microscope frame.Įxample Configurations for Materials Science T-BF: Brightfield (Reflected/Transmitted)ĭIC: Differential interference contrast / Simple polarization Select from 5 stages based on the size of your samples Select from 3 objectives based on your applications Consultation Reception about Introductionĭesigned to use Infrared observation to inspect integrated circuitsĭesigned for observing birefringence characteristics.OEM Microscope Components for Integration.Semiconductor & Flat Panel Display Inspection Microscopes ▾.Aerospace/Wind Blade Inspection Scanners.Flaw Detectors / Phased Array Flaw Detectors ▾.Thickness and Flaw Inspection Solutions ▾.
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